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Hall Effect Measurement Systems
MAGTRANS offers Hall Effect Measurement Systems for determining carrier concentration, mobility, resistivity and Hall coefficient in semiconductor and functional materials under controlled magnetic fields.
DX-70 Hall Measurement System
Measures carrier concentration, mobility, resistivity and Hall coefficient of semiconductor materials.
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DX-100 Hall Effect Measurement Equipment
Integrated electromagnet-based system with precision current source, voltmeter and system software.
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DX-3000 Hall Effect Device
Fully automated system integrating Hall effect, magnetoresistance and IV characteristics testing.
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DX-30 Permanent Magnet Hall Effect Meter
Permanent magnet based Hall measurement system with high-precision Gauss meter and current source.
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DX-60 Hall Effect Measurement Instrument
Electromagnet-based precision Hall effect measurement system for semiconductor materials.
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DX-50 Hall Effect Measurement System
Laboratory Hall measurement system for research and semiconductor device studies.
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High & Low Temperature Hall Effect Test System
Temperature-controlled Hall measurement setup with Dewar and thermal controller.
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DX-1000H High Temperature Hall Measurement Setup
High temperature vacuum Hall measurement system with precision magnetic field control.
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DX-1000L Low Temperature Hall Effect Test System
Low temperature Hall effect test system for cryogenic semiconductor characterisation.
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DX-9000 Electrical Transport Properties Measurement System
Automated transport property measurement system integrating Hall effect and magnetoresistance testing.
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DX-300 Automatic Hall Effect Test System
Fully automatic electromagnetic Hall effect test system with micro-probe integration.
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